Tau Wae:SN74AHC1G125DBVR
- Rā: 2022/03/3
- Te roa: 10 hēkona
- Rahi ataata: 6.87 MB
- Ataata Ataata
Kaihanga waahanga : | SN74ABT18646PM |
---|---|
RoHs Tūnga : | Whakahaerehia te kore utu / RoHS |
Kaihanga / Waitohu : | Luminary Micro / Texas Instruments |
Waehere Stock : | 384 pcs Stock |
Whakaahuatanga : | IC SCAN-TEST-DEV/TXRX 64-LQFP |
Tuhinga mai i : | Hong Kong |
Ngā Rauemi : | |
Te Ara Tuhi : | DHL/Fedex/TNT/UPS/EMS |
Part No. | SN74ABT18646PM |
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Kaihanga | |
Whakaahuatanga | IC SCAN-TEST-DEV/TXRX 64-LQFP |
Whakahaere Toko Whakahaere / RoHS Tūnga | Whakahaerehia te kore utu / RoHS |
He Rahinga Kei te wātea | 384 pcs |
Ngā Rauemi | |
Whakaaetanga Utu | 4.5 V ~ 5.5 V |
Pūrere Pūrere Whakarato | 64-LQFP (10x10) |
Raupapa | 74ABT |
Packaging | Tray |
Paa / Case | 64-LQFP |
Ētahi Ingoa | 296-3943 SN74ABT18646PMG4 SN74ABT18646PMG4-ND |
Tae Mahi | -40°C ~ 85°C |
Tuhinga o mua | 18 |
Momo Tae | Surface Mount |
Taumata Whakaaro Moe (MSL) | 3 (168 Hours) |
Te Tae Kaituku Taeke | 6 Weeks |
Momo Momo | Scan Test Device With Transceivers And Registers |
Whakahaere Toko Whakahaere / RoHS Tūnga | Lead free / RoHS Compliant |
Whakaahuatanga Taipitopito | Scan Test Device With Transceivers And Registers IC 64-LQFP (10x10) |
Tau Wae Tuakiri | 74ABT18646 |
IC BUFFER INVERT 5.5V 20SSOP
IC BUFFER INVERT 5.5V 20SOIC
IC BUFFER INVERT 5.5V 20DIP
IC SCAN-TEST-DEV/TXRX 64-LQFP
IC SCAN TEST DEVICE 18BIT 56SSOP
IC SCAN-TEST-DEV/TXRX 56-TSSOP
IC SCAN TEST DEVICE 20BIT 64LQFP
IC SCAN-TEST-DEV/TXRX 56-SSOP
IC SCAN TEST DEVICE 18BIT 56SSOP
IC BUFFER INVERT 5.5V 20SOIC